Ta/W/AlO_x-Al/Ta/Nb Josephson Junctions for X-Ray Detector

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概要

• 論文の詳細を見る

• We have fabricated a Josephson junction, with an approximately symmetrical gap structure which consists of a Ta/W counter electrode, a Ta/Nb base electrode and an AlO_x-Al barrier for operation as a superconducting X-ray detector at 0.3K A Ta layer is selected due to its long lifetime of quasiparticles and high X-ray absorption effciency. The W layer is selected as a buffer layer for a body centered cubic Ta counter electrode, and Nb layer is chosen for a body centered cubic Ta base electrode The Al layer acts as an overlayer for fabricating the AlO_x barrier. A fabricated junction shows a gap voltage of 1.3mV, a sharp transition width of less than 50μV, and a small subgap leakage current of 1.5μA.

• 社団法人応用物理学会の論文
• 1995-10-15

著者

• Morohashi Shin'ichi

  Fujitsu Laboratories Ltd.

関連論文

• Raman Spectroscopic Study of Nb/AlO_x-Al/Nb Josephson Junctions
• Interfacial Study of Nb Josephson Junctions with Overlayer Structure (Special Section on Superconducting Devices)
• Ta/W/AlO_x-Al/Ta/Nb Josephson Junctions for X-Ray Detector

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