Interfacial Study of Nb Josephson Junctions with Overlayer Structure (Special Section on Superconducting Devices)

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概要

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• We compare interfaces of Nb/AlO_x-Al/Nb and Nb/ZrO_x-Zr/Nb junctions using secondary ion mass spectroscopy and cross-sectional transmission electron microscopy. We have clarified that an interface of the Nb/AlO_x-Al/ Nb junction is drastically different from that of the Nb/ZrO_x-Zr/ Nb junction. An adsorbed water vapor layer plays an important role in suppressing grain boundary diffusion between Nb and Al at the interface of the Nb/AlO_x-Al/Nb junction. In depositing Nb and Al at low power and cooling the substrate, it is important to control the formation of the adsorbed water vapor layer for fabricating Nb/AlO_x-Al/Nb junctions exhibiting excellent current-voltage characteristics.

• 社団法人電子情報通信学会の論文
• 1994-08-25

著者

• Morohashi Shin'ichi

  Fujitsu Laboratories Ltd.

関連論文

• Raman Spectroscopic Study of Nb/AlO_x-Al/Nb Josephson Junctions
• Interfacial Study of Nb Josephson Junctions with Overlayer Structure (Special Section on Superconducting Devices)
• Ta/W/AlO_x-Al/Ta/Nb Josephson Junctions for X-Ray Detector

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