Growth of Bi/Sb Superlattice
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概要
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The present work describes the growth at room temperature of Bi, Sb and Bi-12 at.%Sb films on glass substrates and a Bi/Sb 40-layer superlattice film on a single-crystal Si (111) substrate. Thin-film X-ray diffractometer measurements strongly show the (003) orientation of these films. Four peaks are observed in small-angle X-ray diffraction measurements of the Bi/Sb superlattice film and indicate good periodicity. Direct transmission electron microscopy (TEM) observations also clearly show the superlattice structure.
- 社団法人応用物理学会の論文
- 1992-08-01
著者
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Obata Takeshi
O Kawasaki Steel Corporation
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Takahashi Junzo
Research Institute For Metal Surface Of High Performance Ltd. C
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MIYAGAWA Tsugio
o Kawasaki Steel Corporation
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ARAKI Masatomi
Research Institute for Metal Surface of High Performance, Ltd., c
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Araki Masatomi
Research Institute For Metal Surface Of High Performance Ltd. C
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Miyagawa Tsugio
O Kawasaki Steel Corporation:(present Address) Electronic Materials And Components Research Laborato
関連論文
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