Chemical Beam Etching of GaAs Using a Novel Precursor of Tertiarybutylchloride (TBCl)
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概要
- 論文の詳細を見る
We examined systematically in situ etching with a novel precursor, tertiarybutylchloride (TBCl) in a chemical beam epitaxy system. Reflection high-energy electron diffraction observation revealed that layer-by-layer etching was achieved. While the etching temperature is slightly higher than that for AsCl_3 or AsBr_3, it is still in the range applicable in III-V semiconductor device fabrication. Furthermore, because TBCl is not corrosive to stainless steel or seat materials for valves and has long-term stability at room temperature, it is a promising alternative to AsCl_3 or AsBr_3 from the viewpoint of safety to operators as well as the growth system.
- 社団法人応用物理学会の論文
- 1999-06-15
著者
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Kondow Masahiko
Department Of Electrical And Computer Engineering University Of California:central Research Laborato
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SHI Binqiang
Department of Electrical and Computer Engineering, University of California
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TU Charles
Department of Electrical and Computer Engineering, University of California
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Tu Charles
Department Of Electrical And Computer Engineering University Of California
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Shi Binqiang
Department Of Electrical And Computer Engineering University Of California
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- Chemical Beam Etching of GaAs Using a Novel Precursor of Tertiarybutylchloride (TBCl)
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