Sub-Half-Micron I-Line Lithography by Use of LMR-UV Resist : Lithography Technology
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1989-12-30
著者
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Yamashita Yoshio
Oki Ekectric Industry Co. Ltd.
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Endo Akihiro
Oki Ekectric Industry Co. Ltd.
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Jinbo Hideyuki
Oki Ekectric Industry Co. Ltd.
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NISHIBU Satoshi
Fuji Chemicals Industial Co., Ltd
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UMEHARA Hiroshi
Fuji Chemicals Industial Co., Ltd
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ASANO Takateru
Fuji Chemicals Industial Co., Ltd
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Asano Takateru
Fuji Chemicals Industial Co. Ltd
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Nishibu Satoshi
Fuji Chemicals Industial Co. Ltd
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Umehara Hiroshi
Fuji Chemicals Industial Co. Ltd
関連論文
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- A New Approach of E-beam Proximity Effect Correction for High-Resolution Applications
- Fabrication of X-Ray Mask Using W-CVD for Forming Absorber Pattern : Lithography Technology
- Fabrication of X-Ray Mask Using W-CVD for Forming Absorber Pattern
- Sub-Half-Micron I-Line Lithography by Use of LMR-UV Resist : Lithography Technology
- Sub-Half-Micron i-Line Lithography by Use of LMR-UV Resist