Ambipolar Diffusion Length in CuGaSe_2 Thin Films for Solar Cell Applications Measured by Steady-State Photocarrier Grating Technique
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-12-30
著者
-
ZWEIGART S.
Institut fur Physikalische Elektronik, Universitat Stuttgart
-
SCHOCK H.W.
Institut fur Physikalische Elektronik, Universitat Stuttgart
-
Zweigart S
Univ. Stuttgart Stuttgart Deu
-
Zweigart S.
Institut Fur Physikalische Elektronik Universitat Stuttgart
-
Schock H
Univ. Stuttgart Stuttgart Deu
-
Schock H.w.
Institut Fur Physikalische Elektronik Universitat Stuttgart
-
MENNER R.
Zentrum fur Sonnenenergie- und Wasserstoff-Forschung
-
KLENK R.
Institut fur Physikalische elektronik, Universitat Stuttgart
-
Klenk R
Institut Fur Physikalische Elektronik Universitat Stuttgart
-
Zweigart S.
Institut für Physikalische Elektronik, Universität Stuttgart, 70565 Stuttgart, Germany
関連論文
- Characterization of Polycrystalline Cu(In, Ga)Se_2 Thin Films Produced by Rapid Thermal Processing
- Thermal Decomposition of Ternary Chalcopyrite Thin Films
- Influence of morphology and Structure of Cu/In Alloys on the Properties of CuInSe_2
- Ambipolar Diffusion Length in CuGaSe_2 Thin Films for Solar Cell Applications Measured by Steady-State Photocarrier Grating Technique
- Characterization of Polycrystalline Cu(In,Ga)Se 2 Thin Films Produced by Rapid Thermal Processing