Characterization of Polycrystalline Cu(In, Ga)Se_2 Thin Films Produced by Rapid Thermal Processing
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1997-08-15
著者
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Schon J.h.
Faculty Of Physics University Of Konstanz
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ALBERTS V.
Department of Physics, Rand Afrikaans University
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ZWEIGART S.
Institut fur Physikalische Elektronik, Universitat Stuttgart
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SCHOCK H.W.
Institut fur Physikalische Elektronik, Universitat Stuttgart
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BUCHER E.
Faculty of Physics, University of Konstanz
関連論文
- Characterization of Polycrystalline Cu(In, Ga)Se_2 Thin Films Produced by Rapid Thermal Processing
- Ambipolar Diffusion Length in CuGaSe_2 Thin Films for Solar Cell Applications Measured by Steady-State Photocarrier Grating Technique
- Characterization of Polycrystalline Cu(In,Ga)Se 2 Thin Films Produced by Rapid Thermal Processing