An Application of the Dry Liftoff Method by Molybdenum Oxide Sublimation to CMOS Isolation
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概要
- 論文の詳細を見る
A CMOS isolation process using a dry liftoff is proposed in which a sputter-deposited SiO_2 film is delineated by removing the Mo pattern underneath the SiO_2 film making use of the sublimation of the molybdenum oxide. Test CMOS transistors were fabricated. No significant differences were observed in the characteristics of transistors fabricated by dry- and conventional wet-liftoff techniques.
- 社団法人応用物理学会の論文
- 1986-07-20
著者
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Yamauchi Noriyoshi
Ntt Electrical Communications Laboratories
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Yamauchi Noriyoshi
Ntt Electrical Communication Laboratories
関連論文
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