Thermally Stimulated Current Measurement in Highly Elongated Polyethylene Film

概要

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The trap depth and its density of highly elongated polyethylene have been studied by thermally stimulated current (TSC) measurements. Three discrete traps with depths of 0.13, 0.3 and 0.5 eV have been evaluated using the initial rise method in the temperature region from 77 to 330 K; these changes slightly with the elongation ratio. A trap density of the order of 10^<13>〜10^<14> / cm^3 has been calculated from the area of the TSC peaks. The trap density increases upon increasing the elongation ratio and again decreases at a higher elongation ratio; this is consistent with the elongation dependence of the electric conductivity and carrier mobility. The results are discussed in terms of the molecular orientation examined by X-ray diffraction measurements.
社団法人応用物理学会の論文
1988-02-20