Dielectric Properties of Hydrogen Silsesquioxane Films Degraded by Heat and Plasma Treatment
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-09-15
著者
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Park Jin
R&d Division Lg Semicon Co.
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PARK Jin
R&D Division, LG Semicon. Co., Ltd.
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Shin J‐h
Basic Research Laboratory Electronics And Telecommunications Research Institute
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Shin J‐h
Hyundai Electronics Ind. Co. Ltd. Kyungki‐do Kor
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Chung S‐w
Hynix Semiconductor Co. Ltd. Kyoungki‐do Kor
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Chung Sung-Woong
R&D Division, LG Semicon Co.
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Shin Joo-Han
R&D Division, LG Semicon Co.
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Park Nae-Hak
R&D Division, LG Semicon Co.
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Park Nae-hak
R&d Division Lg Semicon Co.
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