New Characterization Technique for Rubbed Polyimide Film for Liquid Crystal Display
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-11-15
著者
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Hirosawa Ichiro
Device Analysis And Evaluation Technology Center Nec Corporation
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Itoh Satoshi
Device Analysis Technology Laboratories Nec Corporation
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TANOOKA Daisuke
Department of Research and Development, Nippon Laser and Electronics Laboratory
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Tanooka Daisuke
Department Of Research And Development Nippon Laser And Electronics Laboratory
関連論文
- Effect of Soaking in Solvents on Molecular Orientation of Rubbed Polyimide Film
- Influence of Annealing on Molecular Orientation of Rubbed Polyimide Film Observed by Reflection Ellipsometry
- New Characterization Technique for Rubbed Polyimide Film for Liquid Crystal Display
- Characterization of Molecular Orientation of Rubbed Polyimide Film by Grazing Incidence X-ray Scattering
- Color-Imaging Ellipsometer: High-Speed Characterization of In-Plane Distribution of Film Thickness at Nano-Scale