Hirosawa Ichiro | Device Analysis And Evaluation Technology Center Nec Corporation
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概要
関連著者
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Hirosawa Ichiro
Device Analysis And Evaluation Technology Center Nec Corporation
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Hirosawa Ichiro
Device Analysis Technology Laboratories Nec Corporation
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Sasaki Nobuyoshi
Device Analysis And Evaluation Technology Center Nec Corporation
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Hirosawa I
Device Analysis Technology Laboratories Nec Corporation
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MATSUSHITA Tomoharu
Kogakuin University
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MIYAIRI Hiroshi
Kogakuin University
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SAITO Susumu
Kogakuin University
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SASAKI Nobuyoshi
Device Analysis and Evaluation Technology Center, NEC Corporation
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Sasaki N
Toshiba Corp. Yokohama Jpn
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Sasaki Nobuyoshi
Device Analysis Technology Laboratories Nec Corporation
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Itoh Satoshi
Device Analysis Technology Laboratories Nec Corporation
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Sasaki Norihiko
Department Of Nuclear Engineering Faculty Of Engineering Tohoku University:(present Address) Manufac
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TANOOKA Daisuke
Department of Research and Development, Nippon Laser and Electronics Laboratory
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Tanooka Daisuke
Department Of Research And Development Nippon Laser And Electronics Laboratory
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KIMURA Hiroshi
Device Analysis Technology Laboratories, NEC Corporation
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Kimura Hiroshi
Device Analysis Technology Laboratories Nec Corporation
著作論文
- Effect of Soaking in Solvents on Molecular Orientation of Rubbed Polyimide Film
- Influence of Annealing on Molecular Orientation of Rubbed Polyimide Film Observed by Reflection Ellipsometry
- New Characterization Technique for Rubbed Polyimide Film for Liquid Crystal Display
- Characterization of Molecular Orientation of Rubbed Polyimide Film by Grazing Incidence X-ray Scattering