Sasaki Nobuyoshi | Device Analysis And Evaluation Technology Center Nec Corporation
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概要
関連著者
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Sasaki Nobuyoshi
Device Analysis And Evaluation Technology Center Nec Corporation
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SASAKI Nobuyoshi
Device Analysis and Evaluation Technology Center, NEC Corporation
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Sasaki N
Toshiba Corp. Yokohama Jpn
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Sasaki Norihiko
Department Of Nuclear Engineering Faculty Of Engineering Tohoku University:(present Address) Manufac
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Bird J
Department Of Electrical Engineering University At Buffalo
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WIDJAJA A.
Department of Material Science, Chiba University
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AOYAGI Yoshinobu
The Institute of Physical and Chemical Research
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Aoyagi Y
Interdisciplinary Graduate School Of Science & Engineering Tokyo Institute Of Technology
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Aoyagi Yoshinobu
Riren (the Institute Of Physical And Chemical Research)
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Ishibashi K
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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Aoyagi Y
Inst. Physics And Chemical Res. (riken) Wako Jpn
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Aoyagi Y
Semiconductor Laboratory Riken The Institute For Physical And Chemical Research
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Ishibashi K
Sumitomo Electric Ind. Ltd. Hyogo Jpn
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Ferry D
Arizona State Univ. Az Usa
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Ferry David
Department Of Electrical Engineering Arizona State University
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Ishibashi Koji
Department Of Applied Physics And Dimes Delft University Of Technology:the Institute Of Physical And
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OCHIAI Yuichi
Department of Materials Technology, Chiba University
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SUGANO Takuo
Nanoelectronic Materials Laboratory, RIKEN
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YAMAMOTO Kazunuki
Department of Materials Science, Chiba Unviersity
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Aoyagi Y
Riren (the Institute Of Physical And Chemical Research)
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ISHIBASHI Koji
Advanced Device Laboratory, The Institute of Physical and Chemical Research (RIKEN)
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Sasaki N
Basic Process Development Division Fujitsu Limited
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Ishibashi K
Riken Saitama Jpn
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Hirosawa Ichiro
Device Analysis And Evaluation Technology Center Nec Corporation
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Aoyagi Yoshinobu
Nanoelectronic Materials Laboratory Frontier Research Program Riken
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Aoyagi Y
The Institute Of Physical And Chemical Research
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Yamamoto K
Univ. Of Tsukuba
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SASAKI Nobuyuki
Department of Materials Science, Chiba University
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BIRD Jonathan
Nano-electronics, RIKEN
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ISHIBASHI Kohji
Nano-electronics, RIKEN
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AOYAGI Yoshinobu
Nano-electronics, RIKEN
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SUGANO Takuo
Nano-electronics, RIKEN
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Bird Jonathan
Nano-electronics Riken
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Aoyagi Yoshinobu
Semiconductors Laboratory The Institute Of Physical And Chemical Research (riken)
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Aoyagi Yoshinobu
Frontier Research Program Riken
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Yamamoto Koji
Department Of Life Science Aichi University Of Education
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Ishibashi Koji
Semiconductors Laboratory The Institute Of Physical And Chemical Research (riken)
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Sasaki Nahomi
Graduate School Of Pharmaceutical Sciences Chiba University
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Widjaja A.
Department Of Materials Science Chiba University
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Ferry David
Department Of Electrical And Computer Engineering Arizona State University
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Widjaja A.
Department Of Material Science Chiba University
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Ochiai Yuichi
Department Of Materials Science Chiba University
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Aoyagi Y
Inst. Physical And Chemical Res. Riken Wako Jpn
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Yamamoto K
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology (aist)
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Sugano T
Nanoelectronic Materials Laboratory Frontier Research Program Riken
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Sasaki Nobuyuki
Department Of Fishery Science Faculty Of Agriculture Tohoku University
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Yamamoto K
Saga Univ. Saga Jpn
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Widjaja A.Wahju
Department of Materials Science, Chiba University
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OCHIAI Yuichi
Department of Electronics and Mechanical Engineering, Chiba University
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AOYAGI Yoshinobu
Interdisciplinary Graduate School of Science & Engineering, Tokyo Institute of Technology
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Yamamoto Kazunuki
Department of Materials Science, Chiba University, 1–33 Yayoi-cho, Inage-ku, Chiba 263, Japan
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SASAKI Nobuyuki
Department of Bioengineering, Faculty of Engineering, Yokohama National University
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Hirosawa I
Device Analysis Technology Laboratories Nec Corporation
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Hirosawa Ichiro
Device Analysis Technology Laboratories Nec Corporation
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Sasaki Nobuyoshi
Device Analysis Technology Laboratories Nec Corporation
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Sasaki Nobuyoshi
Device Analysis Technology Laboratory Nec Corporation
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KIMURA Hiroshi
Device Analysis Technology Laboratories, NEC Corporation
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Kimura Hiroshi
Device Analysis Technology Laboratories Nec Corporation
著作論文
- Influence of Annealing on Molecular Orientation of Rubbed Polyimide Film Observed by Reflection Ellipsometry
- Phase Breaking of Coherent Electron Waves in Dot Array Systems ( Quantum Dot Structures)
- Trajectory Transition Due to Gate Depletion in Corrugation Gated Quantum Wires
- Characterization of Molecular Orientation of Rubbed Polyimide Film by Grazing Incidence X-ray Scattering
- Simulation of the Voltage Holding Ratio in Liquid Crystal Displays with a Constant Charge Model