Uniform Fabrication of Highly Reliable, 50-60 mW-Class, 685 nm, Window-Mirror Lasers for Optical Data Storage

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概要

• 論文の詳細を見る

• Uniform fabrication of highly reliable 50-60 mW-class 685 nm laser diodes (LDs) with a window-mirror structure has been realized by using selective solid-phase Zn diffusion and three-inch full wafer processing. A window-mirror structure at the LD mirror is formed by Zn-induced disordering of an ordered GaInP multiple quantum-well (MQW) active layer. High uniformity of characteristics such as the operating current and the far-field pattern has been obtained by realization of highly uniform Zn diffusion. A small astigmatic distance (ΔZ ≦ 3 μm), a low relative intensity noise (RIN ≦ -135 dB/Hz) and a high speed response (T_r, T_f ≦ 1.2 ns) are obtained in addition to the high-power and high-temperature characteristics (70 mW, 80℃) in spite of the existence of the window structure. The LDs have exhibited reliable 6,000-10,000 h operation under the conditions of 60℃ and 50-60 mW for the first time.

• 社団法人応用物理学会の論文
• 1997-05-15

著者

• Shima A

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• Shima Akihiro

  Optoelectronic And Microwave Devices R & D Laboratory Mitsubishi Electric Corporation

• TSUGAMI Mari

  Optoelectronic and Microwave Devices R&D Laboratory, Mitsubishi Electric Corporation

• Tsugami Mari

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• TADA Hitoshi

  Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation

• UTAKOJI Takeshi

  Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation

• MOTODA Takashi

  Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation

• NAGAHAMA Koki

  Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation

• AIGA Masao

  Optoelectronic and Microwave Devices Laboratory, Mitsubishi Electric Corporation

• Tada H

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• Aiga Masao

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• Nagahama K

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• Motoda Takashi

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• Shima Akihiro

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

• Utakoji Takeshi

  Optoelectronic And Microwave Devices Laboratory Mitsubishi Electric Corporation

関連論文

• Improvement of InP Crystal Quality on GaAs Substrates by Thermal Cyclic Annealing
• Hign-Power Long-Cavity T^3 Laser with a Very Narrow Beam
• Uniform Fabrication of Highly Reliable, 50-60 mW-Class, 685 nm, Window-Mirror Lasers for Optical Data Storage

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