Observation of <100> Dark Line Defects in Optically Degraded ZnS_xSe_<1-x>-based Light Emitting Diodes by Transmission Electron Microscopy

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概要

著者

Kuo L‐h
Joint Res. Center For Atom Technol. Tsukuba Jpn
Kuo Li-hsin
Department Of Materials And Nuclear Engineering University Of Maryland:(present Address) Joint Resea
Kuo Li-hsin
Joint Research Center For Atom Technology (jrcat)
SALAMANCA-RIBA Lourdes
Department of Materials and Nuclear Engineering, University of Maryland
Salamanca-riba Lourdes
Department Of Materials And Nuclear Engineering University Of Maryland
Salamanca-Riba Louders
Department of Materials and Nuclear Engineering, University of Maryland

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