Kuo L‐h | Joint Res. Center For Atom Technol. Tsukuba Jpn
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概要
関連著者
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Kuo L‐h
Joint Res. Center For Atom Technol. Tsukuba Jpn
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Kuo Li-hsin
Department Of Materials And Nuclear Engineering University Of Maryland:(present Address) Joint Resea
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Kuo Li-hsin
Joint Research Center For Atom Technology (jrcat)
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KIMURA Kozo
Joint Research Center for Atom Technology (JRCAT)
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YASUDA Tetsuji
Joint Research Center for Atom Technology (JRCAT)
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MIWA Shiro
Angstrom Technology Partnership (ATP)
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YAO Takafumi
Angstrom Technology Partnership (ATP), Institute for Materials Research, Tohoku University
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Miwa S
Joint Res. Center For Atom Technol. Tsukuba Jpn
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Miwa Shiro
Okinawa Memorial Institute For Medical Research
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Yasuda T
Joint Research Center For Atom Technology (jrcat)
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Yasuda Tetsuji
Joint Research Center For Atom Technology(jrcat):national Institute For Advanced Interdisciplinary R
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Yasuda Tetsuji
Joint Research Center For Atom Technolog (jrcat)
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KIMURA Keiichi
Advanced Research Laboratory, Nippon Steel Co. Ltd.
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Kimura K
Advanced Research Laboratory Nippon Steel Co. Ltd.
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Kimura Keiichi
R&d Labs-i Nippon Steel Corporation
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Yao Takafumi
Angstrom Technology Partnership (atp) Institute For Materials Research Tohoku University
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Yasuda T
Joint Research Center For Atom Technology(jrcat):national Institute For Advanced Interdisciplinary R
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Kimura K
Department Of Mathematics Toyota National College Of Technology:department Of Physics Nagoya Univers
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Yasuda Takeshi
Department Of Applied Science For Electronics And Materials Graduate School Of Engineering Sciences
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Yasuda Tsutomu
Faculty Of Engineering Tokyo Institute Of Technology
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MIWA Shiro
Joint Research Center for Atom Technology (JRCAT)
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YAO Takafumi
Joint Research Center for Atom Technology (JRCAT)
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TAKASE Aya
Department of Physics, Faculty of Science and Technology, Science Uniersity of Tokyo
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KURIBAYASHI Masaru
Department of Physics, Faculty of Science and Technology, Science Uniersity of Tokyo
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ISHIDA Kohtaro
Department of Physics, Faculty of Science and Technology, Science Uniersity of Tokyo
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TOMITA Hirofumi
Fujitsu Laboratories Ltd.
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KOMIYA Satoshi
Fujitsu Laboratories Ltd.
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TANAKA Kazunobu
Joint Research Center for Atom Technology(JRCAT)
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Jin Cheng-guo
Joint Research Center For Atom Technology (jrcat):national Institute For Advanced Interdisciplinary
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Takase Aya
Department Of Physics Faculty Of Science And Technology Science Uniersity Of Tokyo
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Ishida Kohtaro
Department Of Physics Faculty Of Science And Technology Science Uniersity Of Tokyo
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Komiya Satoshi
Fujitsu Laboratories Lid.
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Komiya S
Japan Synchrotron Radiation Res. Inst. (jasrl Spring-8) Mikazuki‐cho Jpn
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SALAMANCA-RIBA Lourdes
Department of Materials and Nuclear Engineering, University of Maryland
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Kuribayashi Masaru
Depatment Of Physics Faculty Of Science And Technology Science University Of Tokyo
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Kuribayashi Masaru
Department Of Physics Faculty Of Sciense And Technology Science University Of Tokyo
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Kuribayashi Masaru
Department Of Physics Faculty Of Science And Technology Science Uniersity Of Tokyo
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Salamanca-riba Lourdes
Department Of Materials And Nuclear Engineering University Of Maryland
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Tomita H
R 7 D Company Toshiba Corporation
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OHTAKE Akihiro
Joint Research Center for Atom Technology (JRCAT)
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WANG Tai-Hong
Joint Research Center for Atom Technology (JRCAT)
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KUO Li
Joint Research Center for Atom Technology-Angstrom Technology Partnership
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Wang Tai-hong
Joint Research Center For Atom Technology (jrcat):angstrom Technology Partnership (atp)
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Ohtake Akihiro
Joint Research Center For Atom Technology (jrcat):angstrom Technology Partnership (atp)
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Ohtake Akihiro
National Institute For Materials Science (nims)
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Tanaka Kazunobu
Joint Research Center For Atom Technology (jrcat):national Institute For Advanced Interdisciplinary
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Ohtake Akihiro
National Institute For Materials Science
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Salamanca-Riba Louders
Department of Materials and Nuclear Engineering, University of Maryland
著作論文
- Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement
- Observation of Dark Line Defects in Optically Degraded ZnS_xSe_-based Light Emitting Diodes by Transmission Electron Microscopy
- Non-Contact and Non-Destructive Measurement of Carrier Concentration of Nitrogen-Doped ZnSe by Reflectance Difference Spectroscopy
- Structural Change of As-Stabilized GaAs(001)-(2 × 4) and -e(4 × 4)Induced by Zinc Exposure