Experimental Examination of an Overwrite Method Utilizing Leakage Field Modulation by the Laser Power Level
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-02-28
著者
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Ashida Sumio
Storage Materials And Devices Lab. Corporate Research And Development Center Toshiba Corporation
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Kikitsu A
Materials And Devices Labs. R&d Center Toshiba Corp.
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Kikitsu Akira
Toshiba Corp. Corporate R&d Center
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Ichihara Katsutaro
Storage Materials And Devices Lab. Corporate Research And Development Center Toshiba Corporation
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Ichihara Katsutaro
Toshiba Corporation Materials And Devices Laboratory
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ASHIDA Sumio
Toshiba Research and Development Center
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MIZUSAWA Yumi
Toshiba Research and Development Center
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Mizusawa Y
Toshiba Corp. R&d Center
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ASHIDA Sumio
Toshiba Corp., R&D center
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MIZUSAWA Yumi
Toshiba Corp., R&D center
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