Comparison between Atomic Force Microscopic Images of Ionic Crystal Surfaces in Air and in Dry Argon
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概要
- 論文の詳細を見る
We have observed cleavage surfaces of ionic crystals in air and in dry argon using atomic force microscopy (AFM). AFM images from cleavage surfaces of NaCl, KCl, LiF, CaF_2 and BaF_2 clearly exhibit atomically resolved images consisting of anions and cations for both conditions. The AFM image reveals that the force between tip and surface in dry argon is stronger than that in air.
- 社団法人応用物理学会の論文
- 1993-10-15
著者
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Miura Kouji
Department Of Physics Aichi University Of Education
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SHUKUYA Yuko
Department of Physics, Aichi University of Education
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Shukuya Yuko
Department Of Physics Aichi University Of Education
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