The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1969-04-05

著者

• Maruse Susumu

  Faculty Of Engineering Nagoya University

• Kojima Masayuki

  Faculty Of Engineering Nagoya University:(present Address)mitsubishi Heavy Indutries Ltd.

• Uchikawa Yoshiki

  Faculty of Engineering, Nagoya University

• Ichihashi Mikio

  Faculty of Engineering, Nagoya University

• Uchikawa Yoshiki

  Faculty Of Engineering Nagoya University

• Ichihashi Mikio

  Faculty Of Engineering Nagoya University

関連論文

• The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination
• Korrektur vom Offnungsfehler der Elektronenlinse
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• A Variable Ordinal Structure Model for Fuzzy Reasoning and its Application to Dicision of Priorities of Assembling Products (Journal of Japan Society for Fuzzy Theory and Systems)
• Inspection of Micro Devices over the Passivation Top-Layer Surface Using the Low Voltage SEM
• On the Electron Density Distribution in an Image Plane of an Axially-Symmetrical Lens System

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