Electrical Properties of Gallium Phosphide
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概要
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Hall coefficient and conductivity of GaP crystals produced by the solution-growth method were measured at temperatures between 4.2°K and 300°K. Activation energies of donors in undoped, Si-doped and S-doped samples are almost the same indicating about 0.10 eV. In Zn-doped Gap, the level of Zn lies 0.031 eV above the valence band. Electron mobility in undoped samples and hole mobility in Zn-doped samples are 140-180 cm^2/volt・sec and about 50 cm^2/volt・sec respectively at room temperature. These samples exhibited impurity conduction at considerably high temperature, for example, at 50°K for undoped samples, and its characteristics are similar to those of germanium in the metallic and the transition region.
- 社団法人応用物理学会の論文
- 1967-12-05
著者
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Yamamoto Nobuyuki
University Of Osaka Prefecture
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Miyauchi Takeshi
University Of Osaka Prefecture
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Sonomura Hajimu
University of Osaka Prefecture
関連論文
- Preparation of Aluminum Phosphide by Solution-Growth Method
- Note on Impurity Oxygen in Gallium Phosphide
- Electroluminescences of Zn-diffused GaP Diodes and Their Electrical Characteristics
- Electrical Properties of Gallium Phosphide
- Electroluminescence and Crystallographic Polarity of Gallium Antimonide
- Injection Electroluminescence in Gallium Antimonide