Annealing Behavior of Phosphorus Implanted Silicon Crystals
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1977-02-05
著者
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Sasaki Yoshisato
Faculty Of Technology Gunma University
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Sasaki Yoshisato
Faculty Of Engineering Gunma University
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Mitsuishi Tomokuni
Faculty Of Technology Gunma University
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ASAMI Hiroshi
Faculty of Technology, Gunma University
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Asami Hiroshi
Faculty Of Technology Gunma University
関連論文
- A Code-Division Multiplexing Technique for Efficient Data Transmission in VLSI Systems (Special Issue on Integrated Electronics and New System Paradigms)
- Thermal Behavior of B, P and As Atoms in Supersaturated Si Produced by Ion Implantation and Pulsed-Laser Annealing
- Annealing Characteristics of Proton-Implanted p-Type Silicon
- Annealing Behavior of Phosphorus Implanted Silicon Crystals