Applications of Back Reaction Kinetics in Defect Structure Analysis

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概要

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• The narrow half-width of the internal friction peak of some cold worked alloys and the anomalous residual defects of radiation damaged semiconductors are interpreted as an evidence of back reaction process in the annealing kinetics.

• 社団法人応用物理学会の論文
• 1977-10-05

著者

• Fang P.

  Department Of Physics Boston College

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