Topographic Representation of Emission Intensity by the Scanning-Type Field Emission Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1976-10-05
著者
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Okano Tatsuo
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Tominaga Goroh
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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UTAGAWA Kenji
Department of Applied Physics, Faculty of Engineering, The University of Tokyo
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Utagawa Kenji
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo:(present Address) Nippo
関連論文
- Growth of Bismuth Layers on Si(100) Surfaces
- Topographic Representation of Emission Intensity by the Scanning-Type Field Emission Microscope
- An Analysis of the Transient Responses of Acoustic Delay Lines
- An Analogue Simulator Applied to Non-Stationary Vacuum Systems