Current Multiplication Rate at the Peripheries of Buried Junctions

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1974-04-05

著者

• Takamiya Saburo

  Central Research Laboratory Mitsubishi Electric Corp.

• Shirahata Kiyoshi

  Central Research Laboratory Mitsubishi Electric Corp.

• Kondo Akihiro

  Central Res. Lab. Mitsubishi Electric Corp.

• Kondo Akihiro

  Central Research Laboratory Mitsubishi Electric Corp.

関連論文

• Voltage Sensitivity Control of Hyper-Abrupt Capacitance Diode by Vapor Growth Process
• Degradation of Gallium Arsenide Crystals by the Cold-Working Treatment (Abrasion)
• Current Multiplication Rate at the Peripheries of Buried Junctions
• Improvement of Thermal Resistance of Silicon IMPATT Diode

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