X線バックグランド法による非晶質シリカとFe_2O_3の定量

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The background intensity of X-ray diffraction is affected by both of amorphous materials and co-existence elements. When the samples contain heavy elements, generally a background intensity decrease because of absorption effect, however it sometimes increase with fluorescent X-ray, for instance. Fe-K_<α,β> generate when a Fe contained sample is radiated by Cu-K_α. In order to investigate the effect of amorphous silica and Fe_2O_3 on the background intensity, two kinds of samples were prepared, one was mixture of α-quartz, α-cristobalite and Fe-Si-gel (contain Fe_2O_3), another samples were natural quartzites. The investigation of these samples showed that the intensity of Fe-K_<α,β> increase according to diffraction angle 2θ, whereas the main peak of diffraction ring of amorphous silica is obserbed about 2θ=23°. Thus amorphous silica and Fe_2O_3 show different effects on a distribution of back-ground intensity, so it is possible to determine these contents from two background intensities of which 2θ are different. The high・ angle background in this paper is the value of 2θ=39.8° and the low angle is 22.8°. As the content of α-cristobalite has influence on the latter value, which is corrected with that content calculated by X-ray diffraction method. The results of above investigations are as follows. 1) The background intensities of 2θ=39.8° and 22.8° are both affected by the contents of Fe_2O_3 and amorphous silica, but the former mainly propotional to Fe_2O_3% and the latter to amorphous silica % respectively. 2) The relation between Fe_2O_3%, amorphous silica % and two background intensities can be expressed with the equation (1). [numerical formula]
日本粘土学会の論文
1975-02-25

X線バックグランド法による非晶質シリカとFe_2O_3の定量

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