3D MR head sensitivity function using superposition of Lindholm head fields (マルチメディアストレージ--第5回アジア情報記録技術シンポジウム〔英文〕)
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概要
- 論文の詳細を見る
A simple method to obtain three-dimensional MR sensitivity function was provided. Calculated waveform and roll-off curve by using this MR sensitivity function well agreed with both the measured waveform and roll-off curve. It was found that the shape of waveform was strongly correlated with the magnetization profile and the center shift of the MR free layer. The center shift of the free layer degraded the TAA at low linear recording density. However, when the linear recording density was larger than about 500 kfci in our case, the TAA increased with increasing the center shift of the free layer.
- 社団法人映像情報メディア学会の論文
- 2000-11-15
著者
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Lee K.J.
Nano System Lab.
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Im Y.
Nano System Lab. Samsung Advanced Institute Of Technology
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Im Y.h.
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee K.
Nano System Lab. Samsung Advanced Institute Of Technology
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Kim E.
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee B.
Nano System Lab. Samsung Advanced Institute Of Technology
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Park N.
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee T.
Dept. of Materials Science and Engineering
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Kim Y.
Nano System Lab., Samsung Advanced Institute of Technology
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Kim J.
Nano System Lab., Samsung Advanced Institute of Technology
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Lee T.
Dept. Advanced Mater. Eng. Korea Advanced Inst. Of Sci. & Tech. Seoul
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Kim Y.
Nano System Lab. Samsung Advanced Institute Of Technology
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Kim Y.s.
Nano System Lab. Samsung Advanced Institute Of Technology
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Kim J.
Nano System Lab. Samsung Advanced Institute Of Technology
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