3D MR Head Sensitivity Function Using Superposition of the Lindholm Head Fields
スポンサーリンク
概要
- 論文の詳細を見る
A simple method to obtain three-dimensional MR sensitivity function was provided. Calculated waveform and roll-off curve by using this MR sensitivity function well agreed with both the measured waveform and roll-off curve. It was found that the shape of waveform was strongly correlated with the magnetization profile and the center shift of the MR free layer. The center shift of the free layer degraded the TAA at low linear recording density. However, when the linear recording density was larger than about 500 kfci in our case, the TAA increased with increasing the center shift of the free layer.
- 社団法人電子情報通信学会の論文
- 2000-11-08
著者
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Kim J
Pusan National Univ. Busan Kor
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Kim J
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee K.J.
Nano System Lab.
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Im Y.H.
Nano System Lab., Samsung Advanced Institute of Technology
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Kim Y.S.
Nano System Lab., Samsung Advanced Institute of Technology
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Kim E.S.
Nano System Lab., Samsung Advanced Institute of Technology
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Lee K.M.
Nano System Lab., Samsung Advanced Institute of Technology
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Kim J.W.
Nano System Lab., Samsung Advanced Institute of Technology
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Lee B.K.
Nano System Lab., Samsung Advanced Institute of Technology
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Kim J.Y.
Nano System Lab., Samsung Advanced Institute of Technology
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Park N.Y.
Nano System Lab., Samsung Advanced Institute of Technology
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Lee T.D.
Dept.of Materials Science and Engineering
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Im Y.
Nano System Lab. Samsung Advanced Institute Of Technology
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Im Y.h.
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee K.
Nano System Lab. Samsung Advanced Institute Of Technology
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Kim E.s.
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee B.k.
Nano System Lab. Samsung Advanced Institute Of Technology
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Park N.y.
Nano System Lab. Samsung Advanced Institute Of Technology
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Lee T.d.
Dept. Of Material Sci. & Eng. Korea Advanced Inst. Of Sci. & Tech.
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Kim Y.
Nano System Lab. Samsung Advanced Institute Of Technology
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Kim Y.s.
Nano System Lab. Samsung Advanced Institute Of Technology
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