Correlation between Contact Resistance Characteristics and STM Images for Ag-Pd Alloy with Some Additives(Session 7 : Contact Phenomena)
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概要
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STM image is composed by tunnel current. The tunnel current is strongly depending on applied voltage between specimen surface and a probe tip, and on work function of the specimen surface. Therefore, STM image is different from optical images. Under certain applied voltage, the distribution of work function on the surface is directly relates to the image. In the present paper, in order to understand the STM images on the contact surface, surfaces of Ag-Pd alloys with Mg and Cr additives were subjected to the STM. The additives are easily oxidized, their oxide distribute on the surface. Therefore, the effect of the additives on the STM image could observe. For Ag-Pd-Cr, in both case of clean and oxidized surface, as CrO and Cr_2O_3 of Cr oxide are typical insulators, sharp projections such as needles were shown in the images which are very different from optical microscope image. And high contact resistance was measured. On the other hand, for Mg, MgO showed conductive, therefore, smooth surface obtained as the STM image. Contact resistance showed very low level. Even if the oxide grew under heating, same tendency were obtained. Conductivity of oxides on the surface greatly effect on the images. Correlation between contact resistance and the STM images was found.
- 2004-10-15
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