Contact Resistance Performances at Low Temperature

概要

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For low temperature applications of electrical contacts such as cryogenics, contact resistance performances must be studied in detail. The cryogenical performances of contact resistance are also important in clarifying basic contact mechanisms and controlling the contact resistance. This paper presents low temperature dependencies of the contact resistance of clean surface, contaminated surface, and an evaluation of true contact area based on the breakdown of super conduction. Regarding the constriction resistance as a function of the temperature, it was found that a singular phenomenon of the constriction resistance on the clean surface occurred. For the contaminated surface, the Schottky conduction was observed at oxide film covered contacts. Furthermore, size of the true contact area at very low temperature could be evaluated by the breakdown of the superconduction caused by self magnetic field of the contact current.
一般社団法人電子情報通信学会の論文
2001-09-21