Dynamic influence on contact failure (国際セッションIS-EMD2002〔英文〕)

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概要

• 論文の詳細を見る

• Nowadays electronic devices and systems are wildly used in various dynamic environments. It causes a kind of electrical contact instability which is easily to be ignored. That is dynamic influence on contact failure. In this paper, the investigation of contact failure connected with dynamic influences has been done, the way of analyzing the contact failure caused by dynamic factors was discussed, and the result shows that this influence could not be well covered in the experimental testing on new product.

• 社団法人電子情報通信学会の論文
• 2002-11-08

著者

• Xu L‐j

  Beijing Univ. Posts And Telecommunications Beijing Chn

• Xu Liang-jun

  Research Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• Xu Liang-jun

  Research Lab Of Electric Contacts

• Feng Cui-Feng

  Research Lab of Electric Contacts

• Feng Cui-feng

  Research Lab Of Electric Contacts:beijing University Of Posts And Telecommunications

関連論文

• Dynamic Influence on Contact Failure
• Invited paper Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability (国際セッションIS--EMD 2003) -- (Session 6 Contact Phenomena(2))
• Dynamic Influence on Contact Failure(Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
• Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability
• Dynamic influence on contact failure (国際セッションIS-EMD2002〔英文〕)
• Testing Method Study of Contact Resistance Behavior on Contaminated Contact Area (国際セッションIS--EMD 2003) -- (Session 6 Contact Phenomena(2))

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