Dynamic Influence on Contact Failure(<Special Issue>Recent Development of Electro-Mechanical Devices (IS-EMD 2002))

スポンサーリンク

概要

• 論文の詳細を見る

• Nowadays electronic devices and systems are widely used in various dynamic environments. However, they cause electrical contact instability that can easily be ignored. This phenomenon is considered as contact failure caused by a dynamic influence. In this paper, the investigation of contact failure caused by dynamic influences and analysis method for such contact failure are discussed. The results show that a dynamic influence could not be well covered in the experimental testing for a new product.

• 社団法人電子情報通信学会の論文
• 2003-06-01

著者

• Xu Liang-jun

  Research Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• Xu Liang-jun

  Research Lab Of Electric Contacts

関連論文

• Dynamic Influence on Contact Failure
• Invited paper Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability (国際セッションIS--EMD 2003) -- (Session 6 Contact Phenomena(2))
• Dynamic Influence on Contact Failure(Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
• Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability
• Dynamic influence on contact failure (国際セッションIS-EMD2002〔英文〕)

スポンサーリンク