Testing Method Study of Contact Resistance Behavior on Contaminated Contact Area (国際セッションIS--EMD 2003) -- (Session 6 Contact Phenomena(2))

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概要

• 論文の詳細を見る

• Nowadays electronic connectors are widely used in various telecommunication devices. These connectors are easily contaminated because the devices are usually exposed in air. In this paper, the contact resistance behavior on contaminated connector contacts is discussed. In order to evaluate the contact reliability of the contaminated contact, multiple-point test is required in the contact resistance measurement. The results show that the contaminated contact area is a hazard to the reliability of the connector.

• 一般社団法人電子情報通信学会の論文
• 2003-11-14

著者

• Feng Cui-Feng

  Research Lab of Electric Contacts

• Feng Cui-feng

  Research Lab Of Electric Contacts Beijing University

関連論文

• Dynamic influence on contact failure (国際セッションIS-EMD2002〔英文〕)
• Testing Method Study of Contact Resistance Behavior on Contaminated Contact Area (国際セッションIS--EMD 2003) -- (Session 6 Contact Phenomena(2))

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