Measuring AC Emitter and Base Series Resistances in Bipolar Transistors

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概要

• 論文の詳細を見る

• A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying β_o. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact g_m value and the approximated one, I_C/V_T. It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk ocuurs.

• 一般社団法人電子情報通信学会の論文
• 1994-04-25

著者

• Niitsu Youichiro

  Semiconductor Device Engineering Lab. Toshiba Corporation

関連論文

• Analysis of Narrow Emitter Effects in Half-Micron Bipolar Transistors
• Methodology for Latchup-Free Design in Merged BiPMOSs
• Measuring AC Emitter and Base Series Resistances in Bipolar Transistors

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