A Noncontact Thickness Measurement of Thin Samples Using 40 kHz Ultrasonic Wave
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概要
- 論文の詳細を見る
A new system of measuring the thickness of thin film or paper using 40 kHz ultrasonic wave in air is described. The thickness of samples measured is smaller by a factor of several hundreds than the wavelength of sound. Experiments with polymer and metal films and paper are described to demonstrate the measurement possibilities.
- 社団法人電子情報通信学会の論文
- 1993-10-25
著者
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Imano K
Akita Univ. Akita Jpn
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Imano Kazuhiko
Department Of Electrical And Electronic Engineering Faculty Of Engineering And Resource Science Akit
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Imano Kazuhiko
Department Of Electronic Engineering Mining College Akita University
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Imano Kazuhiko
The Mining College Akita University
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Okuyama Daitaro
the Mining College, Akita University
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Chubachi Noriyoshi
the Faculty of Engineering, Tohoku University
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Chubachi Noriyoshi
Tohoku Gakuin Univ.
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Chubachi N
Faculty Of Engineering Tohoku Gakuin University
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Okuyama Daitaro
The Mining College Akita University
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