Gate-to-Bulk Overlap Capacitance Extraction and Its Circuit Verification(<Special Section>Analog Circuit and Device Technologies)
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概要
- 論文の詳細を見る
Gate-to-bulk overlap caracitance (CGBO) cannot be ignored for long gate channel MOSFET's that are used for various I/O and analog circuits. We present a simple and yet accurate CGBO measurement and extractions by using a group of MOSFET's. Dedicated test structures using 0.18μm shallow trench isolation technology were fabricated for the purpose. The effect of CGBO has been successfully analyzed. Validity of the CGBO extraction has been verified by comparing measured time delay of 51 stage ring oscillators with simulated data using our customized UCB SPICE3 simulator.
- 社団法人電子情報通信学会の論文
- 2004-06-01
著者
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SANO Takeshi
Surgical Division, National Cancer Center Hospital
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Sano T
New Materials Research Center Sanyo Electric Co. Ltd.
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Sano Takeshi
Surgical Division National Cancer Center Hospital
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Kawahara Yasuo
Modech Inc.
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Sano Takeshi
Modech Inc.
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SHIMASUE Masanori
MODECH Inc.
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AOKI Hitoshi
MODECH Inc.
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