Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy(Special Issue on Near-Field Optics and Its Applications)
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概要
- 論文の詳細を見る
We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-μm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.
- 社団法人電子情報通信学会の論文
- 2002-12-01
著者
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HIRAGA Takashi
Photonics Research Institutes, National Institute of Advanced Industrial Science and Technology
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Hiraga Takashi
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology
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Hiraga Takashi
Presto Research Development Corporation Of Japan
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YAMAMOTO Noritaka
R&D Group of Application for Device, Photonics Research Institute, National Institute of Advanced In
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HIRAGA Takashi
R&D Group of Application for Device, Photonics Research Institute, National Institute of Advanced In
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Yamamoto N
R&d Group Of Application For Device Photonics Research Institute National Institute Of Advanced
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