Efficient Block-Level Connectivity Verification Algorithms for Embedded Memories(Test)(<Special Section>VLSI Design and CAD Algorithms)

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概要

• 論文の詳細を見る

• A large memory is typically designed with multiple identical memory blocks for reducing delay and power. The circuit verification of individual memory blocks can be effectively handled by the Symbolic Trajectory Evaluation (STE) approach. However, if multiple memory blocks are integrated into a single system, the STE approach cannot verify it economically. This paper introduces algorithms for verifying block-level connectivity of memories. The verification time of a large memory can be reduced drastically by using bottom-up verification scheme. That is, a memory block is first verified thoroughly, and then only the interconnection between memory blocks of the large memory needs to be verified. The proposed verification algorithms require (3n+2(⌈log_2n⌉l+1)+3⌈log_2m&rceil) Read/Write operations for a 2^2×m-bit memory, where n and m are the address width and data width, respectively. Also, the algorithms can verify 100% of the inter-port and intra-port signal misplaced faults of the address, data input, and data output ports.

• 社団法人電子情報通信学会の論文
• 2004-12-01

著者

• Li J‐f

  Department Of Electrical Engineering National Central University

• LI Jin-Fu

  Department of Electrical Engineering, National Central University

• Li Jin-fu

  Department Of Electrical Engineering National Central University

関連論文

• Efficient Block-Level Connectivity Verification Algorithms for Embedded Memories(Test)(VLSI Design and CAD Algorithms)
• An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults(Memory Design and Test,VLSI Design and CAD Algorithms)
• Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults(Memory Testing)(Test and Verification of VLSI)

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