An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults(Memory Design and Test,<Special Section>VLSI Design and CAD Algorithms)

概要

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This paper presents an efficient diagnosis scheme for RAMs. Three March-based algorithms are proposed to diagnose simple functional faults of RAMs. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number. Then a 3N March-like algorithm is used for locating the aggressor words (bits) of coupling faults (CFs) in word-oriented (bit-oriented) memories. It also can distinguish the faults which cannot be identified by the March-15N algorithm. Thus, the proposed diagnosis scheme can achieve full diagnosis and locate aggressors with (15N+3mN) Read/Write operations for a bit-oriented RAM with m CFs. For word-oriented RAMs, a March-like algorithm is also proposed to locate the aggressor bit in the aggressor word with 4log_2B Read/Write operations, where B is the word width. Analysis results show that the proposed diagnosis scheme has higher diagnostic resolution and lower time complexity than the previous fault location and fault diagnosis approaches. A programmable built-in self-diagnosis (BISD) design is also implemented to perform the proposed diagnosis algorithms. Experimental results show that the area overhead of the BISD is small-only about 2.17% and 0.42% for 16K×8-bit and 16K×128-bit SRAMs, respectively.
社団法人電子情報通信学会の論文
2007-12-01