TEM study of the structure and morphology of CoCrNbPt double layer perpendicular magnetic media with Ti, Pt and Ti/Pt intermediate layers.

概要

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The influence of various intermediate layers(Ti, Pt and Ti/Pt)applied between permalloy and Co-Cr-Nb-Pt storage layer was studied by TEM on the microstructure of double layered perpendicular magnetic recording media. In case of Ti intermediate layer an amorphous phase was formed at the interface of the permalloy and Ti layers due to a chemical interaction. The grain size of the subsequently deposited Co-Cr-Nb-Pt was reduced from 20-40 to 10-13nm, however, no remarkable preferred crystal orientation was found. Pt intermediate layer provided(0001)texture of the recording layer, and large grain size comparable with that of the permalloy(20-40nm). TEM showed high stress field at the permalloy-Pt-CoCrNbPt interfaces. The best microstructural and magnetic properties of the samples were achieved by Tint slacked intermediate layer combining the advantages of the two components: Ti(5nm)interrupted heteroepitaxy on permalloy and provided high nucleation density via amorphization. The subsequently deposited Pt (10nm)grew with reduced grain size and preferred(111)orientation. These conditions favored(0001)orientation and small grain size(10-16nm)of the CoCrNbPt layer overgrowth which are the requirements to improve coercivity and noise characteristics.
社団法人電子情報通信学会の論文
2001-08-31