中性子反射率法で見る磁性薄膜材料の磁気構造
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概要
- 論文の詳細を見る
The magnetic structure of a magnetic device, including that of its surface and interface, is closely connected with its function. To achieve high performance, it is therefore essential to obtain information on the magnetic structure. The neutron is very powerful and nondestructive tool for determining this structure. The present article is a brief introduction to neutron reflection measurements, which focus on study magnetic thin films and multilayers.
- 社団法人日本磁気学会の論文
- 2002-10-01
著者
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武田 全康
東北大学大学院理学研究科物理学専攻
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Takeda M
Univ. Tokyo Tokyo Jpn
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Takeda M
Japan Atomic Energy Res. Inst. Ibaraki
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武田 全康
東北大学大学院・理学研究科
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