Application of Phase to Image Processing during the Inspection of Printed Circuit Board by Eddy-Current Testing Probe (論文特集号〔日本応用磁気学会〕第24回学術講演会)

概要

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This paper introduces an innovative image processing technique for the inspection of Printed Circuit Board (PCB) by an Eddy-Current Testing (ECT) probe. The visualization of an inspected model is obtained from a phase of an output signal measured by an lock-in amplifier. Although the lock-in amplifier delivers also information about an amplitude of the output signal, the visualization process can be performed without the amplitude. Information aboutsize of a defect can be extracted from the shape of phase characteristic. Introduction of the phase into image processing allows farther combination of the amplitude with the phase and developing a confirmation process, where information about defects obtained from the amplitude characteristic can be confirmed by information obtained from the phase characteristic.
社団法人日本磁気学会の論文
2001-04-15