Application of a Retarding-type Mott Analyzer to Observation of Magnetic Domains

スポンサーリンク

概要

• 論文の詳細を見る

• We developed a retarding-type Mott analyzer, of which the figure of merit and the size were improved as compared with our previously designed analyzers. The figure of merit of the new analyzer is sufficient to be used in a spin-polarized secondary electron microscope (SP-SEM) system. Equipping a UHV-SEM system with the analyzer and a secondary electron collector, we constructed an SP-SEM system. The proper operation of the system was confirmed by observing a single Fe crystal and we got clear images of domain structures on the Fe (001) surface. We also got a magnetic domain image of a patterned permalloy thin film.

• 社団法人日本磁気学会の論文
• 1999-01-20

著者

• Mukasa K.

  CREST, JST, Nanoelectronics Laboratory, Faculty of Engineering, Hokkaido University

• Kuraoka Y.

  Graduate School Of Engineering Hokkaido University

• Sueoka K.

  Graduate School of Engineering, Hokkaido University

• Iwata T.

  Hokkaido Tokai University

• Aihara R.

  Eiko Engineering Co., Ltd.

• Hayakawa K.

  Catalysis research Center, Hokkaido University

• Sueoka K.

  Graduate School Of Engineering Hokkaido University

• Aihara R.

  Eiko Engineering Co. Ltd.

• Mukasa K.

  Crest Japan Science And Technology Corporation (jst)

関連論文

• Magnetization of Zinc Blende Compound Nanostructures (論文特集号 〔日本応用磁気学会〕第24回学術講演会)
• Spin Electronic States of Wurtzite GaN Nanostructures
• Spin Electronic States of GaN Probes : Magnetism of Nanostructures
• Application of a Retarding-type Mott Analyzer to Observation of Magnetic Domains
• Fabrication and Characterization of an MR Cantilever with a Spin-Valve Sensor for a Scanning Magnetoresistance Microscope
• Magnetic Field Imaging by Scanning Magnetoresistance Microscope with MR Cantilever
• SP-SEM Observation of Magnetic Vortex States in Permalloy Disks

スポンサーリンク