X線回折顕微法によるアルミニウム単結晶の研究

概要

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By the use of Soller slit in the primary beam and a line source of characteristic X-rays, the X-ray diffraction microscopy is extended to allow the detection of imperfection in a crystal lattice. A Soller slit creates a set of virtual X-ray sources. A large number of rays cross at the center of each cell, so that the vertically divergent beam emerging from each cell may be said to issue from the virtual source located at the center of each cell. At the same time the rays are diverging horizontally from the actual source, so that the virtual source is actually a short horizontal line through the center of each cell. there being one virtual source for each cell of the Soller slit. This technique has the advantage of allowing the diffraction patterns from distorted and undistorted region in a crystal lattice to be recorded on the large surface by taking a single photograph. This new technique is applied in the present investigation to a study of the deformation of aluminium single crystal, and it is revealed that the clustered slip regions are rotated relative to matrices after tensile deformation.
社団法人日本材料学会の論文
1966-12-15