The K-Capture Probabilities to 400.56 and 279.48 keV Levels in the Decay of ^<75>Se
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概要
- 論文の詳細を見る
Precisely calibrated high resolution intrinsic semiconductor detector has beenused to find A'-capture probabilities to 400.56 and 279.48 keV levels in the decayof "Se. The measurement to 279.48 keV level is reported for the first time inliterature.
- 一般社団法人日本物理学会の論文
- 1984-02-15
著者
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Sahota H.S.
Department of Physics,Punjabi University
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SINGH K.
Department of Biochemical Engineering and Food Technology, Harcourt Butler Technological Institute
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Singh K.
Department of Agronomy, Institute of Agricultural Sciences, Banaras Hindu University
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- The K-Capture Probabilities to 400.56 and 279.48 keV Levels in the Decay of ^Se