N Type Conversion of Thermally Oxidized Si Surface
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人日本物理学会の論文
- 1962-07-05
著者
-
Morita Yoshinori
Kobe Kogyo (industories) Corp.
-
EDAGAWA Hiroshi
Kobe Kogyo (Industories) Corp.
-
MAEKAWA Syun-ichi
Kobe Kogyo Corp.
-
INUISHI Yoshio
College of Engineering, Osaka University
-
Maekawa Syun-ichi
Kobe Kogyo (industories) Corp.
-
Inuishi Yoshio
College Of Engineering Osaka University
関連論文
- γ Ray Irradiation on MOS Field Effect Transistor
- Electrical Properties of Oxidized Si P-N Junctions
- The Quantitative Evaluation of N-Type Conversion of Thermally Oxidized Si Surface
- Growth and Structure of Si Oxide Films on Si Surface
- Surface Field Effect on the Breakdown of Ge Grain Boundary
- Al Redistribution in Thermally Oxidized Si Surface
- Optical Absorption of Thermally Oxidized Si Oxide Film
- N Type Conversion of Thermally Oxidized Si Surface
- Slow Decay of Reverse Current and Noise in Field Effect on Ge P^+-N Junction
- Surface Field Effect and Noise in Ge Grain Boundary
- γRay Irradiation Effect on Thermally Oxidized Si P-N Junction
- 1/f Noise and Channel in Ge PN Junction
- Drift Mobility of Photo-Injected Electrons in Hexane-Silicone Mixture
- Effect of Thickness on Photoconduction of Colored KCl
- Effects of Vacancies on Pulse Photoconductions in CdS Single Crystals