A New Device for measuring Thickness of Evaporated Metal Film by Use of X-ray Interference Fringes

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概要

• 論文の詳細を見る
• 社団法人日本物理学会の論文
• 1959-12-05

著者

• Yoshida Toshiho

  Institute Of Physics Kyoto Prefectural University Of Medicine

• Fujiki Yoshibumi

  Institute of Physics, Kyoto Prefectural University of Medicine

• Fujiki Yoshibumi

  Institute Of Physics Kyoto Prefectural University Of Medicine

• Fujiki Yoshibumi

  Institute Of Physics Kyoto Prefectural Medical College

関連論文

• Effect of Deposited Metals on the Crystallization Temperature of Amorphous Germanium Film
• A New Device for measuring Thickness of Evaporated Metal Film by Use of X-ray Interference Fringes
• Study on Vacuum Deposition of Metals, I : On the Formation of Alloys by Successive Deposition of Constituent Metal Vapours in Vacuum
• Study on Vacuum Deposition of Metals : II. On the Change with Aging Time in Thickness and Resistivity of Vacuum Deposited Gold Film
• Anomalous Diffusion at the Interface of Thin Bimetallic Film of Bi and Sb

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