Study on Vacuum Deposition of Metals : II. On the Change with Aging Time in Thickness and Resistivity of Vacuum Deposited Gold Film

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概要

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• Changes with aging time in electrical resistivity and thickness of vacuum deposited gold film were measured on the same specimen. Kiessig's X-ray interference method was employed for the measurement of film thickness. It was observed that film thickness decreased in exactly the same manner as the resistivity. The proportionality constant between resistivity change and fractional-volume change was about 2.5 × 10^<-4>ohm・cm which agreed well with the quenching experiment of gold in bulk by Bauerle and Koehler, and this suggests that the resistivity change in vacuum deposited gold film at room temperature is predominantly due to a vacancy mechanism just as the case of quenched material in bulk.

• 社団法人日本物理学会の論文
• 1959-10-05

著者

• Fujiki Yoshibumi

  Institute Of Physics Kyoto Prefectural Medical College

関連論文

• Effect of Deposited Metals on the Crystallization Temperature of Amorphous Germanium Film
• A New Device for measuring Thickness of Evaporated Metal Film by Use of X-ray Interference Fringes
• Study on Vacuum Deposition of Metals, I : On the Formation of Alloys by Successive Deposition of Constituent Metal Vapours in Vacuum
• Study on Vacuum Deposition of Metals : II. On the Change with Aging Time in Thickness and Resistivity of Vacuum Deposited Gold Film
• Anomalous Diffusion at the Interface of Thin Bimetallic Film of Bi and Sb

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