Thickness Transitions of Ferroelectricity in Thin Films : II

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概要

• 論文の詳細を見る

• The exact expressions for defining the critical point of ferroelectric thin films as a function of temperature, film thickness and some other parameters are obtained on the basis of the Tilley-Zeks model. The cases of symmetric and asymmetric extrapolation lengths at the two surfaces of films are investigated. The transition temperature of a ferroelectric thin film will increase or decrease, compared with that of the bulk, according to the sign of two extrapolation lengths. But in the mixed-sign case, it is governed by the relative effectiveness, i.e., by the absolute values of the two.

• 社団法人日本物理学会の論文
• 2002-06-15

著者

• Ishibashi Yoshihiro

  Faculty Of Business Aichi Shukutoku University

• Tilley D

  Department Of Physics University Of Essex

• Ishibashi Yoshihiro

  Faculty Of Communications Aichi Shukutoku University

• Orihara Hiroshi

  Department Of Applied Physics Graduate School Of Engineering Nagoya University

• TILLEY David

  Department of Physics, University of Essex

• Tilley David

  Department Of Physics Universiti Sains Malaysia

• Orihara Hiroshi

  Department Of Applied Physics Graduate School Of Engineering Hokkaido University

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