Atomic Parameters in Ferroelectric SbSI
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概要
- 論文の詳細を見る
- 社団法人日本物理学会の論文
- 1966-02-05
著者
-
Oka Yoshio
Sony Corporation Research Laboratory
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Sawaguchi Etsuro
Sony Corporation Research Laboratory
-
Kikuchi Atsushi
Sony Corporation Research Laboratory
-
Mori Toshio
Sony Corporation Research Laboratory
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KIKUCHI Atsushi
Sony Corporation, Research Laboratory
関連論文
- A Method for Detecting Ferroelectric Activity
- Microscopic Examination of SrTiO_3 at Low Temperatures
- Dielectric Constant of Strontium Titanate at Low Temperatures
- Ferroelectric Hysteresis Character of YMnO_3
- Observation of the First Order Phase Change of SbSI
- Specific Heat Measurement of Ferroelectric SbSI
- Preparation of Ferroelectric SbSI Single Crystals
- Anomalous Etch Rate of Silicon Nitride Films Made from SiCl_4-NH_3-H_2 System
- Crystal Structure Determination of SbSI
- Atomic Parameters in Ferroelectric SbSI
- Effect of Photoconduction on the Phase Transition of Ferroelectric SbSI
- Space Charge Drifting Pattern in SbSI
- Stripe Pattern and Negative Resistance in SbSi
- Effect of Light on the Paraelectic-Ferroelectric Phase Boundary of SbSI