Observation of an Anomaly in Transistor Characteristics

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概要

• 論文の詳細を見る
• 社団法人日本物理学会の論文
• 1960-08-05

著者

• Nakahara Osamu

  Semiconductor Division Tokyo Sanyo Electric Company

• Nakahara Osamu

  Semiconductor Plant Sanyo Electric Company

関連論文

• X-Ray Micrographic Observation of Imperfections in Si Wafer near the Oxide Film Edge before and after the Localized Diffusion
• Dynatron-Type Negative Resistance Observed in the Collector-Voltage-Saturation Region of the Junction Transistor
• Effects of the Collector Depletion Layer Width on the Characteristics of Drift Transistor
• The Base Resistance of the Transistor in the Saturated Region
• Observation of an Anomaly in Transistor Characteristics

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